A graph-based algorithm for NVM address decoders testing - Scaramuzza, Pierre; Kern, Thomas; Coppetta, Matteo; Grossi, Alessandro; Ullmann, Rudolf (Proceedings - International Test Conference, 2024)
Keywords: decoder; Decoding; graph; memory; Memory management; Microcontrollers; Nonvolatile memory; Observability; Production; RRAM; Software; Software algorithms; Technological innovation; test; Testing