Low-power test planning for arbitrary at-speed delay-test clock schemes - Zoellin, Christian G; Wunderlich, Hans-Joachim (2010 28th VLSI Test Symposium (VTS), 2010)
Keywords: Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Clocks; Combinational circuits; Delay; Delay test; Electrical fault detection; Energy consumption; Fault detection; power-aware testing