On the Efficient Evaluation of Self and Mutual Admittances of CPW-Fed Slot Elements in Linear Arrays on Electrically Thin Substrates

The evaluation of self and mutual admittances of CPW-fed slots on electrically thin dielectric substrates is addressed with reference to iterative array design procedures. A characterization of isolated slot self-properties indicated certain linear dependencies on slot dimensions, suggesting that le...

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Bibliographic Details
Published in2008 38th European Microwave Conference : 27-31 October 2008 pp. 1318 - 1321
Main Authors Jacobs, J.P., Joubert, J.
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.10.2008
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ISBN2874870064
9782874870064
DOI10.1109/EUMC.2008.4751706

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Summary:The evaluation of self and mutual admittances of CPW-fed slots on electrically thin dielectric substrates is addressed with reference to iterative array design procedures. A characterization of isolated slot self-properties indicated certain linear dependencies on slot dimensions, suggesting that less data may be required from computationally intensive a priori moment-method analyses of isolated slots. An approximate method for the fast, accurate calculation of mutual admittance between CPW-fed slots on electrically thin substrates is described. Its accuracy is shown to be comparable to moment-method-based calculations in IE3D. The method can be easily incorporated into iterative array design algorithms.
ISBN:2874870064
9782874870064
DOI:10.1109/EUMC.2008.4751706