Statistical Breakdown Measurement Technique for Monitoring Diode-Switch Reliability in Active Matrix LCD Production

An important aspect in the production of high quality active matrix addressed liquid crystal displays (AMILCDs) is the operational reliability of the electrical switching devices in the active matrix. Failing pixels in the display may occur if the switches on the glass substrate are subject to elect...

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Bibliographic Details
Published inESSDERC '95 : proceedings of the 25th European Solid State Device Research Conference, 1995 : 25-27 September 1995 pp. 331 - 334
Main Authors Bijlsma, S.J., van Kranenburg, H., Nieuwesteeg, K.J.B.M., Pitt, M.G., Verweij, J.F.
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.09.1995
Subjects
Active matrix addressing
Active matrix liquid crystal displays
Active matrix organic light emitting diodes
Condition monitoring
Electric breakdown
Glass
Liquid crystal displays
Measurement techniques
Production
Switches
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ISBN9782863321829
286332182X

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Summary:An important aspect in the production of high quality active matrix addressed liquid crystal displays (AMILCDs) is the operational reliability of the electrical switching devices in the active matrix. Failing pixels in the display may occur if the switches on the glass substrate are subject to electrical breakdown. In this study, a measurement method is presented that uses forced electrical breakdown on many samples (10 3 -10 4 ) of thin film diodes (TFDs), that are used as switches in TFD-R displays. The method allows us to obtain information on extrinsic defect densities and failure modes related to the production process, as well as the limits of electrical reliability of the switches.
ISBN:9782863321829
286332182X