Statistical Breakdown Measurement Technique for Monitoring Diode-Switch Reliability in Active Matrix LCD Production - Bijlsma, S.J.; van Kranenburg, H.; Nieuwesteeg, K.J.B.M.; Pitt, M.G.; Verweij, J.F. (ESSDERC '95 : proceedings of the 25th European Solid State Device Research Conference, 1995 : 25-27 September 1995, 1995)
Keywords: Active matrix addressing; Active matrix liquid crystal displays; Active matrix organic light emitting diodes; Condition monitoring; Electric breakdown; Glass; Liquid crystal displays; Measurement techniques; Production; Switches