APA (7th ed.) Citation

Bijlsma, S., van Kranenburg, H., Nieuwesteeg, K., Pitt, M., & Verweij, J. (1995, September). Statistical Breakdown Measurement Technique for Monitoring Diode-Switch Reliability in Active Matrix LCD Production. ESSDERC '95 : proceedings of the 25th European Solid State Device Research Conference, 1995 : 25-27 September 1995, 331-334.

Chicago Style (17th ed.) Citation

Bijlsma, S.J, H. van Kranenburg, K.J.B.M Nieuwesteeg, M.G Pitt, and J.F Verweij. "Statistical Breakdown Measurement Technique for Monitoring Diode-Switch Reliability in Active Matrix LCD Production." ESSDERC '95 : Proceedings of the 25th European Solid State Device Research Conference, 1995 : 25-27 September 1995 Sep. 1995: 331-334.

MLA (9th ed.) Citation

Bijlsma, S.J, et al. "Statistical Breakdown Measurement Technique for Monitoring Diode-Switch Reliability in Active Matrix LCD Production." ESSDERC '95 : Proceedings of the 25th European Solid State Device Research Conference, 1995 : 25-27 September 1995, Sep. 1995, pp. 331-334.