Diagnosis of design-silicon timing mismatch with feature encoding and importance ranking - the methodology explained - Bastani, P.; Callegari, N.; Wang, L.-C.; Abadir, M.S. (2008 IEEE International Test Conference, 2008)
Keywords: Application specific integrated circuits; Delay; Encoding; Engines; Kernel; Predictive models; Silicon; Support vector machine classification; Support vector machines; Timing