APA (7th ed.) Citation

Bastani, P., Callegari, N., Wang, L., & Abadir, M. (2008, October). Diagnosis of design-silicon timing mismatch with feature encoding and importance ranking - the methodology explained. 2008 IEEE International Test Conference, 1-10. https://doi.org/10.1109/TEST.2008.4700588

Chicago Style (17th ed.) Citation

Bastani, P., N. Callegari, L.-C Wang, and M.S Abadir. "Diagnosis of Design-silicon Timing Mismatch with Feature Encoding and Importance Ranking - the Methodology Explained." 2008 IEEE International Test Conference Oct. 2008: 1-10. https://doi.org/10.1109/TEST.2008.4700588.

MLA (9th ed.) Citation

Bastani, P., et al. "Diagnosis of Design-silicon Timing Mismatch with Feature Encoding and Importance Ranking - the Methodology Explained." 2008 IEEE International Test Conference, Oct. 2008, pp. 1-10, https://doi.org/10.1109/TEST.2008.4700588.