APA (7th ed.) Citation

Lasi, D., Tulej, M., Neuland, M. B., Wurz, P., Carzaniga, T. S., Nesteruk, K. P., . . . Elsener, H. R. (2017, July). Testing the Radiation Hardness of Thick-Film Resistors for a Time-Of-Flight Mass Spectrometer at Jupiter with 18 MeV Protons. Workshop record (IEEE Radiation Effects Data Workshop), 1-9. https://doi.org/10.1109/NSREC.2017.8115474

Chicago Style (17th ed.) Citation

Lasi, D., M. Tulej, M. B. Neuland, P. Wurz, T. S. Carzaniga, K. P. Nesteruk, S. Braccini, and H. R. Elsener. "Testing the Radiation Hardness of Thick-Film Resistors for a Time-Of-Flight Mass Spectrometer at Jupiter with 18 MeV Protons." Workshop Record (IEEE Radiation Effects Data Workshop) Jul. 2017: 1-9. https://doi.org/10.1109/NSREC.2017.8115474.

MLA (9th ed.) Citation

Lasi, D., et al. "Testing the Radiation Hardness of Thick-Film Resistors for a Time-Of-Flight Mass Spectrometer at Jupiter with 18 MeV Protons." Workshop Record (IEEE Radiation Effects Data Workshop), Jul. 2017, pp. 1-9, https://doi.org/10.1109/NSREC.2017.8115474.