RFID application challenges and risk analysis - Xiao-dan Wu; Yun-feng Wang; Jun-bo Bai; Hai-yan Wang; Chao-Hsien Chu (2010 IEEE 17Th International Conference on Industrial Engineering and Engineering Management, 2010)
Keywords: Hardware; Industries; Metals; Radiofrequency identification; RFID; RFID risk; RFID risk assessment; risk management; Software; Transportation