Normalized Adaptive Random Test for Integration Tests - Shin, Seung-Hun; Park, Seung-Kyu; Choi, Kyung-Hee; Jung, Ki-Hyun (2010 IEEE 34th Annual Computer Software and Applications Conference Workshops, 2010)
Keywords: Adaptive Random Testing; Closed box; Distortion; Integration Testing; Partitioning algorithms; Random Test; Software; Software algorithms; Software development management; Software measurement; Strips; Subspace constraints; Test case selection; Testing