Directional radiation monitoring system using ANN-based algorithm - Chung, Y.S.; Baek, H.K.; Kang, I.S.; Baek, M.K.; Lee, S.; Kim, S.Y.; Chung, Y.H. (IEEE conference record - Nuclear Science Symposium & Medical Imaging Conference., 2023)
Keywords: Collimators; Machine learning algorithms; Radiation monitoring; Semiconductor detectors; Semiconductor device measurement; Shape; Training