Thickness effect of sputtered ZnO seed layer on the electrical properties of Li-doped ZnO nanorods and application on the UV photodetector - Kung, C. Y.; Young, S. L.; Kao, M. C.; Chen, H. Z.; Lin, J. H.; Lin, H. H.; Horng, L.; Shih, Y. T. (2013 IEEE 5th International Nanoelectronics Conference (INEC), 2013)
Keywords: Current measurement; Lithium; nanorod and UV photodetector; Nanorods; P-type semiconductors; Photodetectors; seed layer; Seeds; Semiconductor device measurement; Semiconductors; Substrates; Thickness; Thickness measurement; Zinc oxide; ZnO