System-Level Measurement-Based Design Optimization by Space Mapping Technology - Rayas-Sanchez, Jose E.; Bandler, John W. (2022 IEEE/MTT-S International Microwave Symposium - IMS 2022, 2022)
Keywords: Area measurement; Bayesian; Broyden; design automation; Electric potential; Electric variables measurement; Extraterrestrial measurements; Integrated circuit modeling; Kriging; machine learning; Microwave circuits; Microwave measurement; optimization; post-fabrication tuning; post-silicon validation; space mapping; surrogate modeling