Thermal analysis and its application to high power GaN HEMT amplifiers - Prejs, A.; Wood, S.; Pengelly, R.; Pribble, W. (2009 IEEE MTT-S International Microwave Symposium Digest, 2009)
Keywords: Gallium nitride; GaN; HEMTs; High power amplifiers; IR scan; large-signal model; Power amplifiers; Power measurement; Pulse measurements; Pulse modulation; Radio frequency; SiC; Temperature measurement; Thermal resistance; thermal simulation; transistor amplifier