Improving the Robustness of a Softcore Processor against SEUs by Using TMR and Partial Reconfiguration - Ichinomiya, Yoshihiro; Tanoue, Shiro; Amagasaki, Motoki; Iida, Masahiro; Kuga, Morihiro; Sueyoshi, Toshinori (2010 18th IEEE Annual International Symposium on Field-Programmable Custom Computing Machines, 2010)
Keywords: Circuit faults; ECC; Field programmable gate arrays; Frequency synchronization; Partial Reconfiguration; Radiation effects; Random access memory; Redundancy; Robustness; Sequential circuits; SEU; Single event transient; Single event upset; Softcore Processor; TMR