Extension of X-parameters to include long-term dynamic memory effects - Verspecht, J.; Horn, J.; Betts, L.; Gunyan, D.; Pollard, R.; Gillease, C.; Root, D.E. (2009 IEEE MTT-S International Microwave Symposium Digest, 2009)
Keywords: behavioral model; Communication switching; Distortion measurement; frequency domain; measurements; memory effects; Microwave measurements; Microwave theory and techniques; NVNA; PHD model; Predictive models; Pulse amplifiers; Pulse measurements; Radio frequency; Radiofrequency identification; RF signals; X-parameters