Extension of X-parameters to include long-term dynamic memory effects

• Published in: 2009 IEEE MTT-S International Microwave Symposium Digest pp. 741 - 744
• Main Authors: Verspecht, J., Horn, J., Betts, L., Gunyan, D., Pollard, R., Gillease, C., Root, D.E.
• Format: Conference Proceeding
• Language: English
• Published: IEEE 01.06.2009
• Subjects: behavioral model; Communication switching; Distortion measurement; frequency domain; measurements; memory effects; Microwave measurements; Microwave theory and techniques; NVNA; PHD model; Predictive models; Pulse amplifiers; Pulse measurements; Radio frequency; Radiofrequency identification; RF signals; X-parameters
• ISBN: 1424428033; 9781424428038
• ISSN: 0149-645X
• DOI: 10.1109/MWSYM.2009.5165803

A new unified theory and methodology is presented to characterize and model long-term memory effects of microwave components by extending the poly-harmonic distortion (PHD) model to include dynamics that are identified from pulsed envelope X-parameter measurements on an NVNA. The model correctly predicts the transient RF response to time-varying RF excitations including the asymmetry between off-to-on and on-to-off switched behavior as well as responses to conventional wide-bandwidth communication signals that excite long-term memory effects in power amplifiers. The model is implemented in the ADS circuit envelope simulator.