Performance-effective operation below Vcc-min - Ladas, Nikolas; Sazeides, Yiannakis; Desmet, Veerle (2010 IEEE International Symposium on Performance Analysis of Systems & Software (ISPASS), 2010)
Keywords: Circuit faults; Clocks; Costs; Degradation; Dynamic voltage scaling; Frequency; Low voltage; Manufacturing processes; Performance loss; Threshold voltage