A cross-layer framework for designing and optimizing deeply-scaled FinFET-based SRAM cells under process variations - Shafaei, Alireza; Shuang Chen; Yanzhi Wang; Pedram, Massoud (The 20th Asia and South Pacific Design Automation Conference, 2015)
Keywords: Circuit stability; Energy consumption; FinFETs; Logic gates; SRAM cells; Stability analysis