Degradation Monitoring Through Software-controlled On-chip Sensors for RISC-V - Ghasemi, S. Maryam; Krautter, Jonas; Gheshlaghi, Tara; Meschkov, Sergej; Gnad, Dennis R. E.; Tahoori, Mehdi B. (Proceedings - European Test Workshop, 2024)
Keywords: Degradation; Delays; Sensors; System-on-chip; Temperature measurement; Temperature sensors; Transient analysis