APA (7th ed.) Citation

Kircher, D., Deutschmann, B., & Profanter, S. (2023, September 20). A Modular Approach of an Electromagnetic Compatibility Test System for Integrated Circuits. 2023 Austrochip Workshop on Microelectronics (Austrochip), 19-22. https://doi.org/10.1109/Austrochip61217.2023.10285156

Chicago Style (17th ed.) Citation

Kircher, Daniel, Bernd Deutschmann, and Simon Profanter. "A Modular Approach of an Electromagnetic Compatibility Test System for Integrated Circuits." 2023 Austrochip Workshop on Microelectronics (Austrochip) 20 Sep. 2023: 19-22. https://doi.org/10.1109/Austrochip61217.2023.10285156.

MLA (9th ed.) Citation

Kircher, Daniel, et al. "A Modular Approach of an Electromagnetic Compatibility Test System for Integrated Circuits." 2023 Austrochip Workshop on Microelectronics (Austrochip), 20 Sep. 2023, pp. 19-22, https://doi.org/10.1109/Austrochip61217.2023.10285156.