Prevention of Space Charge Accumulation and Space Charge Induced Breakdown Using Electrets

In this study, we numerically and experimentally demonstrate the validity of incorporating electrets for space charge induced dielectric breakdown prevention. Numerical models that represent our experiments have been built and simulated in COMSOL Multiphysics software. The simulation results clearly...

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Published inElectrical Insulation Conference and Electrical Manufacturing Expo pp. 1 - 5
Main Authors Saha, Pradip Chandra, Faruqe, Omar, Park, Chanyeop
Format Conference Proceeding
LanguageEnglish
Published IEEE 18.06.2023
Subjects
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ISSN2576-6791
DOI10.1109/EIC55835.2023.10177352

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Abstract In this study, we numerically and experimentally demonstrate the validity of incorporating electrets for space charge induced dielectric breakdown prevention. Numerical models that represent our experiments have been built and simulated in COMSOL Multiphysics software. The simulation results clearly exhibit the prevention of space charge injection and accumulation that can be achieved via electrets. In the experimental validation, first, we fabricate electrets using the polyvinylidene fluoride (PVDF) by triode corona charging and measure the charge embedded in the electrets through an electrostatic voltmeter. Second, we measure the breakdown voltage of a regular dielectric and a regular dielectric coated with an electret film under DC voltage. The difference in the breakdown voltage of the two cases will demonstrate the efficacy of electrets as the prevention mechanism of space charge injection and accumulation.
AbstractList In this study, we numerically and experimentally demonstrate the validity of incorporating electrets for space charge induced dielectric breakdown prevention. Numerical models that represent our experiments have been built and simulated in COMSOL Multiphysics software. The simulation results clearly exhibit the prevention of space charge injection and accumulation that can be achieved via electrets. In the experimental validation, first, we fabricate electrets using the polyvinylidene fluoride (PVDF) by triode corona charging and measure the charge embedded in the electrets through an electrostatic voltmeter. Second, we measure the breakdown voltage of a regular dielectric and a regular dielectric coated with an electret film under DC voltage. The difference in the breakdown voltage of the two cases will demonstrate the efficacy of electrets as the prevention mechanism of space charge injection and accumulation.
Author Faruqe, Omar
Saha, Pradip Chandra
Park, Chanyeop
Author_xml – sequence: 1
  givenname: Pradip Chandra
  surname: Saha
  fullname: Saha, Pradip Chandra
  email: pcsaha@uwm.edu
  organization: University of Wisconsin-Milwaukee,Department of Electrical Engineering,Milwaukee,WI,USA
– sequence: 2
  givenname: Omar
  surname: Faruqe
  fullname: Faruqe, Omar
  email: ofaruqe@uwm.edu
  organization: University of Wisconsin-Milwaukee,Department of Electrical Engineering,Milwaukee,WI,USA
– sequence: 3
  givenname: Chanyeop
  surname: Park
  fullname: Park, Chanyeop
  email: chanyeop@uwm.edu
  organization: University of Wisconsin-Milwaukee,Department of Electrical Engineering,Milwaukee,WI,USA
BookMark eNpVkMtOwzAQRQ0Cibb0DxDyD6R4YnvsLEvUQqVKIFE2bKpJPCmB1qmSFMTfg3gsWJ3FObqLOxQnsYksxCWoCYDKrmaL3Fqv7SRVqZ6AAue0TY_EEBCtybQBdSwGqXWYoMvgTIy77kWpr04jGhiIp_uW3zj2dRNlU8mHPZUs82dqNyynZXnYHbb0LSmG_3YRw6HkIK9bptfQvEf52NVxI2dbLvuW--5cnFa07Xj8y5FYzWer_DZZ3t0s8ukyqVNl-gQLDeg1B58h-UIH51C7AqyBjMma4BDYeyoKStGi8hRMVSoyuqgCkR6Ji5_ZmpnX-7beUfux_rtCfwK-y1U1
ContentType Conference Proceeding
DBID 6IE
6IH
CBEJK
RIE
RIO
DOI 10.1109/EIC55835.2023.10177352
DatabaseName IEEE Electronic Library (IEL) Conference Proceedings
IEEE Proceedings Order Plan (POP) 1998-present by volume
IEEE Xplore All Conference Proceedings
IEEE Electronic Library (IEL)
IEEE Proceedings Order Plans (POP) 1998-present
DatabaseTitleList
Database_xml – sequence: 1
  dbid: RIE
  name: IEEE Electronic Library (IEL)
  url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/
  sourceTypes: Publisher
DeliveryMethod fulltext_linktorsrc
Discipline Engineering
EISBN 1665493410
9781665493413
EISSN 2576-6791
EndPage 5
ExternalDocumentID 10177352
Genre orig-research
GrantInformation_xml – fundername: Office of Naval Research
  funderid: 10.13039/100000006
GroupedDBID 6IE
6IH
6IL
6IN
AAWTH
ABLEC
ADZIZ
ALMA_UNASSIGNED_HOLDINGS
BEFXN
BFFAM
BGNUA
BKEBE
BPEOZ
CBEJK
CHZPO
IEGSK
IJVOP
M43
OCL
RIE
RIL
RIO
ID FETCH-LOGICAL-i204t-6b31683ed896a8b3d77637b15419ea54d761e88abba265608ad4fc0a43bfdaa3
IEDL.DBID RIE
IngestDate Wed Aug 27 02:17:31 EDT 2025
IsPeerReviewed false
IsScholarly false
Language English
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-i204t-6b31683ed896a8b3d77637b15419ea54d761e88abba265608ad4fc0a43bfdaa3
PageCount 5
ParticipantIDs ieee_primary_10177352
PublicationCentury 2000
PublicationDate 2023-June-18
PublicationDateYYYYMMDD 2023-06-18
PublicationDate_xml – month: 06
  year: 2023
  text: 2023-June-18
  day: 18
PublicationDecade 2020
PublicationTitle Electrical Insulation Conference and Electrical Manufacturing Expo
PublicationTitleAbbrev EIC
PublicationYear 2023
Publisher IEEE
Publisher_xml – name: IEEE
SSID ssj0001736641
Score 1.9164852
Snippet In this study, we numerically and experimentally demonstrate the validity of incorporating electrets for space charge induced dielectric breakdown prevention....
SourceID ieee
SourceType Publisher
StartPage 1
SubjectTerms Breakdown voltage
Corona
Dielectric
Dielectric measurement
Electret
High Voltage
Numerical models
Space charge
Voltage measurement
Voltmeters
Title Prevention of Space Charge Accumulation and Space Charge Induced Breakdown Using Electrets
URI https://ieeexplore.ieee.org/document/10177352
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV3PS8MwFA5uJ734a-JvcvDarlnTJD3q2JiCQ3DC8DKS5lVk0Iq2F_9687LWOUHwFhrSlLzQ917yvu8j5Mp5sZwxEwWJ1jbgxqhA8dggwIdBxoxNPR3D_VRMnvjdPJk3YHWPhQEAX3wGITb9Xb4tsxqPyvq4faSLGDqkI2W6AmutD1RkLARnDQqYRWl_dDtM3JxJiBLhYTt4Q0bFe5HxLpm286-KR5ZhXZkw-_xFzfjvD9wjvTVgjz58u6J9sgXFAdn5wTV4SJ5bsqayoGVOH12uDBQv21-AXmfuzY2OF9WF3exFdY8MLL1x8eXSuqyd-joDOvIKOlB99MhsPJoNJ0EjrBC8DiJeBcKgXFUMVqVCKxNb6f4y0rhoiqWgE26lYKCUNkYPkJxHacvzLNLOiLnVOj4i3aIs4JjQ3CWhgFGMszjPOVMisoBZjxroWFl1Qnq4Sou3FXXGol2g0z-en5FtNBbWYjF1TrrVew0XzutX5tJb-wty8atS
linkProvider IEEE
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV3PS8MwFH7oPKgXf038bQ5e2zVrmqZHHRubbkNwwvAykuZVZNCKdhf_epOsVScI3kpL25BX-r6XvO_7AK5MFssoVYEXSak9ppTwBAuVJfhQTKnSiZNjGI15_5HdTqNpRVZ3XBhEdM1n6NtDt5evi3Rhl8pa9vOJDWJYh43IlBXxkq71vaQSh5wzWvGAaZC0uoNOZN4a-dYk3K9vXzFScXmktwPjegTL9pG5vyiVn378Emf89xB3oflN2SP3X8loD9Yw34ftH2qDB_BUyzUVOSky8mCqZSR2u_0ZyXVqnlw5eRGZ69Wr1t8jRU1uDMKca1O3E9dpQLrOQwfL9yZMet1Jp-9V1greSztgpceVNawKUYuES6FCHZv_TKwMnqIJyojpmFMUQiol21aeR0jNsjSQJoyZljI8hEZe5HgEJDNlKFocY2LOMkYFDzTauke0ZSi0OIamnaXZ61I8Y1ZP0Mkf5y9hsz8ZDWfDwfjuFLZs4GxnFhVn0CjfFnhuMECpLlzkPwGj6q6j
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=proceeding&rft.title=Electrical+Insulation+Conference+and+Electrical+Manufacturing+Expo&rft.atitle=Prevention+of+Space+Charge+Accumulation+and+Space+Charge+Induced+Breakdown+Using+Electrets&rft.au=Saha%2C+Pradip+Chandra&rft.au=Faruqe%2C+Omar&rft.au=Park%2C+Chanyeop&rft.date=2023-06-18&rft.pub=IEEE&rft.eissn=2576-6791&rft.spage=1&rft.epage=5&rft_id=info:doi/10.1109%2FEIC55835.2023.10177352&rft.externalDocID=10177352