Machine Learning Algorithms for Detection of Noisy/Artifact-Corrupted Epochs of Visual Oddball Paradigm ERP Data

Electroencephalography (EEG) is a non-invasive monitoring method that tracks and records the neural activities of the brain. The time-locked capture of the EEG to the external stimuli is known as Event-Related Potential (ERP) and it can help elucidate how the brain responds to the stimuli. In genera...

Full description

Saved in:
Bibliographic Details
Published in2022 7th International Conference on Data Science and Machine Learning Applications (CDMA) pp. 169 - 174
Main Authors Akhter, Rafia, Beyette, Fred R.
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.03.2022
Subjects
Online AccessGet full text
DOI10.1109/CDMA54072.2022.00033

Cover

Abstract Electroencephalography (EEG) is a non-invasive monitoring method that tracks and records the neural activities of the brain. The time-locked capture of the EEG to the external stimuli is known as Event-Related Potential (ERP) and it can help elucidate how the brain responds to the stimuli. In general, EEG is an uneven mixture of neural and non-neural sources of activities and these non-neural (non-EEG) signals produce artifacts in the EEG that can decrease the SNR in experiments and may lead to erroneous conclusions about the effects of experimental manipulation. Thus, it is very important to remove artifacts from the recorded EEG prior to analysis. The most common artifacts impacting ERPs are eye-blink, eye-movement, and body-movement. These artifacts-corrupted data can be removed by visual inspection or by computer-automated signal processing methods. While these methods are suitable for post-processing of collected ERP applications, they not well-suited for real-time processing of continuous ERP data. This project seeks to address the challenges associated with real-time identification of artifacts by introducing a machine learning model that can screen ERP, detect and reject artifact-corrupted data epochs prior to signal analysis. In addition to enabling real-time pre-processing of streaming ERP data, the DBScan machine-learning methods explored here can provide up to 90% accuracy in the identification of artifacts-mixed ERP epochs. As a result, the findings of this study will help to improve the signal quality of ERP trials and will enable ERP to be used as a biomarker in real-world applications where streaming EEG data collection and analysis are required.
AbstractList Electroencephalography (EEG) is a non-invasive monitoring method that tracks and records the neural activities of the brain. The time-locked capture of the EEG to the external stimuli is known as Event-Related Potential (ERP) and it can help elucidate how the brain responds to the stimuli. In general, EEG is an uneven mixture of neural and non-neural sources of activities and these non-neural (non-EEG) signals produce artifacts in the EEG that can decrease the SNR in experiments and may lead to erroneous conclusions about the effects of experimental manipulation. Thus, it is very important to remove artifacts from the recorded EEG prior to analysis. The most common artifacts impacting ERPs are eye-blink, eye-movement, and body-movement. These artifacts-corrupted data can be removed by visual inspection or by computer-automated signal processing methods. While these methods are suitable for post-processing of collected ERP applications, they not well-suited for real-time processing of continuous ERP data. This project seeks to address the challenges associated with real-time identification of artifacts by introducing a machine learning model that can screen ERP, detect and reject artifact-corrupted data epochs prior to signal analysis. In addition to enabling real-time pre-processing of streaming ERP data, the DBScan machine-learning methods explored here can provide up to 90% accuracy in the identification of artifacts-mixed ERP epochs. As a result, the findings of this study will help to improve the signal quality of ERP trials and will enable ERP to be used as a biomarker in real-world applications where streaming EEG data collection and analysis are required.
Author Akhter, Rafia
Beyette, Fred R.
Author_xml – sequence: 1
  givenname: Rafia
  surname: Akhter
  fullname: Akhter, Rafia
  email: rafia.akhter@uga.edu
  organization: University of Georgia,School of Electrical and Computer Engineering,Athens,USA
– sequence: 2
  givenname: Fred R.
  surname: Beyette
  fullname: Beyette, Fred R.
  email: Fred.Beyette@uga.edu
  organization: University of Georgia,School of Electrical and Computer Engineering,Athens,USA
BookMark eNotjMlOwzAUAI0EB1r4Ajj4B9I-r0mOUVoWKaUVAq6V19ZSGkeOe-jfA4LDaC6jmaHrIQ4OoUcCC0KgXrarTSM4lHRBgdIFADB2hWZESsEJEA63aNwocwyDw51TaQjDATf9IaaQj6cJ-5jwymVncogDjh6_xTBdlk3KwSuTizamdB6zs3g9RnOcfpOvMJ1Vj7fWatX3eKeSsuFwwuv3HV6prO7QjVf95O7_PUefT-uP9qXots-vbdMVgQLLhWZOg_Klr43QNadCgqXWcimEq90PJdWiAkmMsZJxAUKArrjXVSU1qQWbo4e_b3DO7ccUTipd9nXJJJOUfQN4dFbD
CODEN IEEPAD
ContentType Conference Proceeding
DBID 6IE
6IL
CBEJK
RIE
RIL
DOI 10.1109/CDMA54072.2022.00033
DatabaseName IEEE Electronic Library (IEL) Conference Proceedings
IEEE Xplore POP ALL
IEEE Xplore All Conference Proceedings
IEEE Electronic Library (IEL)
IEEE Proceedings Order Plans (POP All) 1998-Present
DatabaseTitleList
Database_xml – sequence: 1
  dbid: RIE
  name: IEEE Electronic Library (IEL)
  url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/
  sourceTypes: Publisher
DeliveryMethod fulltext_linktorsrc
EISBN 1665410140
9781665410144
EndPage 174
ExternalDocumentID 9736362
Genre orig-research
GroupedDBID 6IE
6IL
CBEJK
RIE
RIL
ID FETCH-LOGICAL-i203t-b3eb0af7f9c5b942560d2dd4655e9e5e972b58061ccd63450550b84fb886b1953
IEDL.DBID RIE
IngestDate Thu Jun 29 18:36:58 EDT 2023
IsPeerReviewed false
IsScholarly false
Language English
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-i203t-b3eb0af7f9c5b942560d2dd4655e9e5e972b58061ccd63450550b84fb886b1953
PageCount 6
ParticipantIDs ieee_primary_9736362
PublicationCentury 2000
PublicationDate 2022-March
PublicationDateYYYYMMDD 2022-03-01
PublicationDate_xml – month: 03
  year: 2022
  text: 2022-March
PublicationDecade 2020
PublicationTitle 2022 7th International Conference on Data Science and Machine Learning Applications (CDMA)
PublicationTitleAbbrev CDMA
PublicationYear 2022
Publisher IEEE
Publisher_xml – name: IEEE
Score 1.8199689
Snippet Electroencephalography (EEG) is a non-invasive monitoring method that tracks and records the neural activities of the brain. The time-locked capture of the EEG...
SourceID ieee
SourceType Publisher
StartPage 169
SubjectTerms detection
Electric potential
Electroencephalography
Electroencephalography (EEG)
Event-Related Potential (ERP)
Inspection
Machine learning
Neural activity
noisy epochs
Real-time systems
Visualization
Title Machine Learning Algorithms for Detection of Noisy/Artifact-Corrupted Epochs of Visual Oddball Paradigm ERP Data
URI https://ieeexplore.ieee.org/document/9736362
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV3LS8MwHA5zJ08qm_gmB4926yNtk-PYgyF0DnGy28irW7FrSx8H_etN2jpFPHgIhDSQkpR8vzTf9_0AuBeuwAQJZnA79A0kETZoKE0Dc51zVIQKEvRBMVh48xV6XLvrDng4aGGklDX5TA50tb7LFymv9K-yIfEdr95wj3yfNFqtVg1nmWQ4ngQjbSen5VV2bcOps-H-yJlSQ8bsBARfgzVMkbdBVbIB__jlw_jftzkF_W9xHlweYOcMdGTSA1lQkyIlbP1St3AUb1N18N_tC6jiUjiRZU26SmAawkUaFe_DkfpotK7BGKd5XmUq9ITTLOW7Qnd5jYqKxvBJCEbjGC5pTkW03cPp8xJOaEn7YDWbvoznRptMwYhs0ykN5khm0tAPCXcZQTrSEbYQ2j5NEqmKbzMXK3TnXHgOUoGRazKMQoaxx_Rd2znoJmkiLwD09CMLU4tSjijxsGuzEBFh2ULaluCXoKdna5M1fhmbdqKu_m6-Bsd6vRpe1w3olnklbxXQl-yuXuFP--yq2g
linkProvider IEEE
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1NT4MwGG7MPOhJzWb8tgePsgErUI7LPjJ1zMVsZrelX2xEBoSPg_56W8BpjAcPTZpCUtISnvelz_O8ANxxi2MXcaox03c0JBDWiC90DTNVc5T7EhJUouhN7fECPS6t5R6432lhhBAl-Uy0Vbc8y-cxK9Svso7rdO3yg7tvyazCqdRatR7O0N1Of-D1lKGcEliZpRGnqof7o2pKCRqjI-B9TVdxRd7aRU7b7OOXE-N_n-cYtL7leXC2A54TsCeiJki8khYpYO2Yuoa9cB3L1H-zzaCMTOFA5CXtKoKxD6dxkL13evK1UcoGrR-naZHI4BMOk5htMnXLa5AVJITPnFMShnBGUsKD9RYOX2ZwQHLSAovRcN4fa3U5BS0w9W6u0a6gOvEd32UWdZGKdbjJuTJQE66QzTGphSW-M8btLpKhkaVTjHyKsU3VadspaERxJM4AtNUlAxODEIaIa2PLpD5yuWFyYRqcnYOmWq1VUjlmrOqFuvh7-BYcjOfeZDV5mD5dgkO1dxXL6wo08rQQ1xL2c3pT7vYnI0yuKw
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Abook&rft.genre=proceeding&rft.title=2022+7th+International+Conference+on+Data+Science+and+Machine+Learning+Applications+%28CDMA%29&rft.atitle=Machine+Learning+Algorithms+for+Detection+of+Noisy%2FArtifact-Corrupted+Epochs+of+Visual+Oddball+Paradigm+ERP+Data&rft.au=Akhter%2C+Rafia&rft.au=Beyette%2C+Fred+R.&rft.date=2022-03-01&rft.pub=IEEE&rft.spage=169&rft.epage=174&rft_id=info:doi/10.1109%2FCDMA54072.2022.00033&rft.externalDocID=9736362