Hardware-in-the-Loop Testing of an Intelligent Electronic Device for Innovative UFLS Protection - Ilievska, R.; Mihalic, R.; Kushnikov, E.; Zakonjsek, J.; Rudez, U. (2021 IEEE Madrid PowerTech, 2021)
Keywords: Frequency measurement; hardware-in-the-loop testing; intelligent electronic device; Load shedding; Microgrids; Power system stability; rate-of-change of frequency; real-time simulation; Real-time systems; Stability criteria; Systems operation; under-frequency load shedding protection