Image Super-Resolution Quality Assessment: Structural Fidelity Versus Statistical Naturalness

Single image super-resolution (SISR) algorithms reconstruct high-resolution (HR) images with their low-resolution (LR) counterparts. It is desirable to develop image quality assessment (IQA) methods that can not only evaluate and compare SISR algorithms, but also guide their future development. In t...

Full description

Saved in:
Bibliographic Details
Published inInternational Workshop on Quality of Multimedia Experience pp. 61 - 64
Main Authors Zhou, Wei, Wang, Zhou, Chen, Zhibo
Format Conference Proceeding
LanguageEnglish
Published IEEE 14.06.2021
Subjects
Online AccessGet full text
ISSN2472-7814
DOI10.1109/QoMEX51781.2021.9465479

Cover

More Information
Summary:Single image super-resolution (SISR) algorithms reconstruct high-resolution (HR) images with their low-resolution (LR) counterparts. It is desirable to develop image quality assessment (IQA) methods that can not only evaluate and compare SISR algorithms, but also guide their future development. In this paper, we assess the quality of SISR generated images in a two-dimensional (2D) space of structural fidelity versus statistical naturalness. This allows us to observe the behaviors of different SISR algorithms as a tradeoff in the 2D space. Specifically, SISR methods are traditionally designed to achieve high structural fidelity but often sacrifice statistical naturalness, while recent generative adversarial network (GAN) based algorithms tend to create more natural-looking results but lose significantly on structural fidelity. Furthermore, such a 2D evaluation can be easily fused to a scalar quality prediction. Interestingly, we find that a simple linear combination of a straightforward local structural fidelity and a global statistical naturalness measures produce surprisingly accurate predictions of SISR image quality when tested using public subject-rated SISR image datasets. Code of the proposed SFSN model is publicly available at https://github.con/weizhou-geek/SFSN.
ISSN:2472-7814
DOI:10.1109/QoMEX51781.2021.9465479