Data compression using mixed cascade of nonlinear logic - Das, Sunil R.; Shaw, Danny L.; Biswas, Satyendra N.; Assaf, Mansour H.; Morton, Scott; Ozkarahan, Irem; Petriu, Emil M.; Groza, Voicu (2013 IEEE International Instrumentation and Measurement Technology Conference (I2MTC), 2013)
Keywords: Aliasing-free (zero-aliasing) space compaction; ATALANTA; Benchmark testing; Built-in self-test; built-in self-testing in very large scale integration circuits and systems; Circuit faults; Compaction; fault detection and conditional fault detection compatibility; Integrated circuit modeling; Logic gates