Technology and design aspects of ultra-thin silicon chips for bendable electronics

Plastic electronics, thin-film-transistors on foil and ultra-thin chips on foil are technologies currently pursued to support the strongly emerging market for flexible electronics. Ultra-thin CMOS chips in such systems will provide solutions whenever high circuit performance and/or complexity are re...

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Published in2009 IEEE International Conference on IC Design and Technology pp. 149 - 154
Main Authors Richter, H., Rempp, H.D., Hassan, M.-U., Harendt, C., Wacker, N., Zimmermann, M., Burghartz, J.N.
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.05.2009
Subjects
Online AccessGet full text
ISBN1424429331
9781424429332
ISSN2381-3555
DOI10.1109/ICICDT.2009.5166284

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Abstract Plastic electronics, thin-film-transistors on foil and ultra-thin chips on foil are technologies currently pursued to support the strongly emerging market for flexible electronics. Ultra-thin CMOS chips in such systems will provide solutions whenever high circuit performance and/or complexity are required. Ultra-thin Si chips (6 to 20 mum) are fabricated by using a recently introduced technology based on the pre/post-process modules Chipfilm TM and PickCrack&Place TM combined with a standard CMOS process. Prior to CMOS processing 200 nm cavities are formed beneath the chip surface. The silicon quality is very comparable to that of bulk control wafers leading to similar process parameters and parameter variations. Fully operational digital and mixed-signal circuits having 30 k and 38 k/2.7k digital/analog CMOS transistors, respectively, are built on ultra-thin silicon chips by using an in-house CMOS gate array technology. The issue of piezoresistive effects in MOS transistors is studied on test transistors and small test circuits, where mechanical stress was introduced by bending a system of chip mounted on 50-mum Kapton foil. The results are compared to bulk silicon measurements. In addition, effects to circuit design, particularly on parametric yield, are deduced. The Chipfilm TM technology not only offers ultra-thin CMOS chips for electronic foil systems but can also be exploited for 3D circuit integration.
AbstractList Plastic electronics, thin-film-transistors on foil and ultra-thin chips on foil are technologies currently pursued to support the strongly emerging market for flexible electronics. Ultra-thin CMOS chips in such systems will provide solutions whenever high circuit performance and/or complexity are required. Ultra-thin Si chips (6 to 20 mum) are fabricated by using a recently introduced technology based on the pre/post-process modules Chipfilm TM and PickCrack&Place TM combined with a standard CMOS process. Prior to CMOS processing 200 nm cavities are formed beneath the chip surface. The silicon quality is very comparable to that of bulk control wafers leading to similar process parameters and parameter variations. Fully operational digital and mixed-signal circuits having 30 k and 38 k/2.7k digital/analog CMOS transistors, respectively, are built on ultra-thin silicon chips by using an in-house CMOS gate array technology. The issue of piezoresistive effects in MOS transistors is studied on test transistors and small test circuits, where mechanical stress was introduced by bending a system of chip mounted on 50-mum Kapton foil. The results are compared to bulk silicon measurements. In addition, effects to circuit design, particularly on parametric yield, are deduced. The Chipfilm TM technology not only offers ultra-thin CMOS chips for electronic foil systems but can also be exploited for 3D circuit integration.
Author Wacker, N.
Zimmermann, M.
Richter, H.
Hassan, M.-U.
Rempp, H.D.
Harendt, C.
Burghartz, J.N.
Author_xml – sequence: 1
  givenname: H.
  surname: Richter
  fullname: Richter, H.
  organization: Inst. for Microelectron., Stuttgart, Germany
– sequence: 2
  givenname: H.D.
  surname: Rempp
  fullname: Rempp, H.D.
  organization: Inst. for Microelectron., Stuttgart, Germany
– sequence: 3
  givenname: M.-U.
  surname: Hassan
  fullname: Hassan, M.-U.
  organization: Inst. for Microelectron., Stuttgart, Germany
– sequence: 4
  givenname: C.
  surname: Harendt
  fullname: Harendt, C.
  organization: Inst. for Microelectron., Stuttgart, Germany
– sequence: 5
  givenname: N.
  surname: Wacker
  fullname: Wacker, N.
  organization: Inst. for Microelectron., Stuttgart, Germany
– sequence: 6
  givenname: M.
  surname: Zimmermann
  fullname: Zimmermann, M.
  organization: Inst. for Microelectron., Stuttgart, Germany
– sequence: 7
  givenname: J.N.
  surname: Burghartz
  fullname: Burghartz, J.N.
  organization: Inst. for Microelectron., Stuttgart, Germany
BookMark eNo1UMtqwzAQVGkCTdJ8QS76AadavXUsbpsGAoXie5DldaLiysFyD_n7GprOZZhhZmFnSWapT0jIBtgWgLmnfbkvX6otZ8xtFWjNrbwja2csSC4ld0K6e7L8FwJmZMGFhUIopeZkOfWsY1YZ80DWOX-xCVIJ4HZBPisM59R3_elKfWpogzmeEvX5gmHMtG_pTzcOvhjPMdEcuxj6RMM5XjJt-4HWmBpfd0ixm_JDn2LIj2Te-i7j-sYrUr29VuV7cfjY7cvnQxHBqLFowHrbKIvTP9qK2hoefKN9CzAZk5aCG6YFC8E40KgZ1DVyB6HVAZ1Ykc3f2YiIx8sQv_1wPd7mEb9-mlbI
ContentType Conference Proceeding
DBID 6IE
6IL
CBEJK
RIE
RIL
DOI 10.1109/ICICDT.2009.5166284
DatabaseName IEEE Electronic Library (IEL) Conference Proceedings
IEEE Xplore POP ALL
IEEE Xplore All Conference Proceedings
IEEE Electronic Library (IEL)
IEEE Proceedings Order Plans (POP All) 1998-Present
DatabaseTitleList
Database_xml – sequence: 1
  dbid: RIE
  name: IEEE Electronic Library (IEL)
  url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/
  sourceTypes: Publisher
DeliveryMethod fulltext_linktorsrc
Discipline Engineering
EISBN 9781424429349
142442934X
EndPage 154
ExternalDocumentID 5166284
Genre orig-research
GroupedDBID 6IE
6IF
6IH
6IK
6IL
6IN
AAJGR
AAWTH
ADZIZ
ALMA_UNASSIGNED_HOLDINGS
BEFXN
BFFAM
BGNUA
BKEBE
BPEOZ
CBEJK
CHZPO
IPLJI
OCL
RIE
RIL
ID FETCH-LOGICAL-i175t-d18a8d58e662683b872cad6af116263b843270630cc7916e601bbe291cf6ce93
IEDL.DBID RIE
ISBN 1424429331
9781424429332
ISSN 2381-3555
IngestDate Wed Aug 27 02:11:40 EDT 2025
IsPeerReviewed false
IsScholarly true
LCCN 2008908577
Language English
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-i175t-d18a8d58e662683b872cad6af116263b843270630cc7916e601bbe291cf6ce93
PageCount 6
ParticipantIDs ieee_primary_5166284
PublicationCentury 2000
PublicationDate 2009-May
PublicationDateYYYYMMDD 2009-05-01
PublicationDate_xml – month: 05
  year: 2009
  text: 2009-May
PublicationDecade 2000
PublicationTitle 2009 IEEE International Conference on IC Design and Technology
PublicationTitleAbbrev ICICDT
PublicationYear 2009
Publisher IEEE
Publisher_xml – name: IEEE
SSID ssj0000453128
ssj0002001151
ssj0055196
Score 1.7811295
Snippet Plastic electronics, thin-film-transistors on foil and ultra-thin chips on foil are technologies currently pursued to support the strongly emerging market for...
SourceID ieee
SourceType Publisher
StartPage 149
SubjectTerms Circuit testing
CMOS analog integrated circuits
CMOS digital integrated circuits
CMOS integrated circuits
CMOS process
CMOS technology
Consumer electronics
electrochemical processes
flexible structures
MOSFETs
piezoresistivity
Plastics
Silicon
stress
System testing
Title Technology and design aspects of ultra-thin silicon chips for bendable electronics
URI https://ieeexplore.ieee.org/document/5166284
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV3JTsMwELXanuDC0iJ2-cARt7Gz2DkXKooEQqhIvVVeJmqhSqsmufD1OE6aAuLALckhiRdpnmfee4PQjTFRxGQSEGCRTwIuDYnBA8KNDoCBlKF0LN_n6OEteJyG0xa6bbQwAODIZ9AvL10t36x0UabKBiG1LxZBG7W5iCqtVpNPsdDEpzWUfncFthLsNHQPCwziqtGcoMTG2HAr8rLhzqdb76f6ntX2RNSLB-PheHg3qYwt6-__aMTi4tDoAD1tR1DRTz76Ra76-vOXueN_h3iIejvFH35pYtkRakF6jPa_mRV20esuC49larBx3A8snVYzw6sEF8t8I0k-X6Q4WyztFkuxni_WGbbAGCuwh3-1BLxrvJP10GR0Pxk-kLojA1lYmJETQ4UUJhRgfzISvhKcaWkimVBautooEfiMly5eWnOLO8Ge9pQCFlOdRBpi_wR10lUKpwhzlhifgQYVJAH3QuEZSEq7NbtAsWZwhrrl5MzWlefGrJ6X878fX6C9qspTEhEvUSffFHBlwUKurt0u-QLYBLXF
linkProvider IEEE
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV3LTsJAFJ0gLtSNDzC-nYVLB5jptJ2uUQIKxBhM2JF53AaUFALtxq93-qCoceGu7aKZV3LP3HvOuQjdGeN5TIacAPMcwn1pSAAtIL7RHBhI6cqM5Tv0um_8aeyOK-i-1MIAQEY-g0b6mNXyzUInaaqs6VL7Y8F30K7LOXdztVaZUbHgxKEFmH7PSmwp3CkJHxYaBHmrOUGJjbLuRuZlA55DN-5PxTsrDIpoK2j22r32wyi3tixG8KMVSxaJOodosJlDTkD5aCSxaujPX_aO_53kEapvNX_4pYxmx6gC0Qk6-GZXWEOv2zw8lpHBJmN_YJmpNdd4EeJkHq8kiaezCK9nc3vIIqyns-UaW2iMFdjrv5oD3rbeWdfRqPM4andJ0ZOBzCzQiImhQgrjCrCD9ISjhM-0NJ4MKU19bZTgDvNTHy-tfYs8wd73lAIWUB16GgLnFFWjRQRnCPssNA4DDYqH3G-5omUgTA3X7AYFmsE5qqWLM1nmrhuTYl0u_v58i_a6o0F_0u8Nny_Rfl7zSWmJV6garxK4ttAhVjfZifkClYO5Eg
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Abook&rft.genre=proceeding&rft.title=2009+IEEE+International+Conference+on+IC+Design+and+Technology&rft.atitle=Technology+and+design+aspects+of+ultra-thin+silicon+chips+for+bendable+electronics&rft.au=Richter%2C+H.&rft.au=Rempp%2C+H.D.&rft.au=Hassan%2C+M.-U.&rft.au=Harendt%2C+C.&rft.date=2009-05-01&rft.pub=IEEE&rft.isbn=9781424429332&rft.issn=2381-3555&rft.spage=149&rft.epage=154&rft_id=info:doi/10.1109%2FICICDT.2009.5166284&rft.externalDocID=5166284
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=2381-3555&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=2381-3555&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=2381-3555&client=summon