Technology and design aspects of ultra-thin silicon chips for bendable electronics
Plastic electronics, thin-film-transistors on foil and ultra-thin chips on foil are technologies currently pursued to support the strongly emerging market for flexible electronics. Ultra-thin CMOS chips in such systems will provide solutions whenever high circuit performance and/or complexity are re...
Saved in:
| Published in | 2009 IEEE International Conference on IC Design and Technology pp. 149 - 154 |
|---|---|
| Main Authors | , , , , , , |
| Format | Conference Proceeding |
| Language | English |
| Published |
IEEE
01.05.2009
|
| Subjects | |
| Online Access | Get full text |
| ISBN | 1424429331 9781424429332 |
| ISSN | 2381-3555 |
| DOI | 10.1109/ICICDT.2009.5166284 |
Cover
| Abstract | Plastic electronics, thin-film-transistors on foil and ultra-thin chips on foil are technologies currently pursued to support the strongly emerging market for flexible electronics. Ultra-thin CMOS chips in such systems will provide solutions whenever high circuit performance and/or complexity are required. Ultra-thin Si chips (6 to 20 mum) are fabricated by using a recently introduced technology based on the pre/post-process modules Chipfilm TM and PickCrack&Place TM combined with a standard CMOS process. Prior to CMOS processing 200 nm cavities are formed beneath the chip surface. The silicon quality is very comparable to that of bulk control wafers leading to similar process parameters and parameter variations. Fully operational digital and mixed-signal circuits having 30 k and 38 k/2.7k digital/analog CMOS transistors, respectively, are built on ultra-thin silicon chips by using an in-house CMOS gate array technology. The issue of piezoresistive effects in MOS transistors is studied on test transistors and small test circuits, where mechanical stress was introduced by bending a system of chip mounted on 50-mum Kapton foil. The results are compared to bulk silicon measurements. In addition, effects to circuit design, particularly on parametric yield, are deduced. The Chipfilm TM technology not only offers ultra-thin CMOS chips for electronic foil systems but can also be exploited for 3D circuit integration. |
|---|---|
| AbstractList | Plastic electronics, thin-film-transistors on foil and ultra-thin chips on foil are technologies currently pursued to support the strongly emerging market for flexible electronics. Ultra-thin CMOS chips in such systems will provide solutions whenever high circuit performance and/or complexity are required. Ultra-thin Si chips (6 to 20 mum) are fabricated by using a recently introduced technology based on the pre/post-process modules Chipfilm TM and PickCrack&Place TM combined with a standard CMOS process. Prior to CMOS processing 200 nm cavities are formed beneath the chip surface. The silicon quality is very comparable to that of bulk control wafers leading to similar process parameters and parameter variations. Fully operational digital and mixed-signal circuits having 30 k and 38 k/2.7k digital/analog CMOS transistors, respectively, are built on ultra-thin silicon chips by using an in-house CMOS gate array technology. The issue of piezoresistive effects in MOS transistors is studied on test transistors and small test circuits, where mechanical stress was introduced by bending a system of chip mounted on 50-mum Kapton foil. The results are compared to bulk silicon measurements. In addition, effects to circuit design, particularly on parametric yield, are deduced. The Chipfilm TM technology not only offers ultra-thin CMOS chips for electronic foil systems but can also be exploited for 3D circuit integration. |
| Author | Wacker, N. Zimmermann, M. Richter, H. Hassan, M.-U. Rempp, H.D. Harendt, C. Burghartz, J.N. |
| Author_xml | – sequence: 1 givenname: H. surname: Richter fullname: Richter, H. organization: Inst. for Microelectron., Stuttgart, Germany – sequence: 2 givenname: H.D. surname: Rempp fullname: Rempp, H.D. organization: Inst. for Microelectron., Stuttgart, Germany – sequence: 3 givenname: M.-U. surname: Hassan fullname: Hassan, M.-U. organization: Inst. for Microelectron., Stuttgart, Germany – sequence: 4 givenname: C. surname: Harendt fullname: Harendt, C. organization: Inst. for Microelectron., Stuttgart, Germany – sequence: 5 givenname: N. surname: Wacker fullname: Wacker, N. organization: Inst. for Microelectron., Stuttgart, Germany – sequence: 6 givenname: M. surname: Zimmermann fullname: Zimmermann, M. organization: Inst. for Microelectron., Stuttgart, Germany – sequence: 7 givenname: J.N. surname: Burghartz fullname: Burghartz, J.N. organization: Inst. for Microelectron., Stuttgart, Germany |
| BookMark | eNo1UMtqwzAQVGkCTdJ8QS76AadavXUsbpsGAoXie5DldaLiysFyD_n7GprOZZhhZmFnSWapT0jIBtgWgLmnfbkvX6otZ8xtFWjNrbwja2csSC4ld0K6e7L8FwJmZMGFhUIopeZkOfWsY1YZ80DWOX-xCVIJ4HZBPisM59R3_elKfWpogzmeEvX5gmHMtG_pTzcOvhjPMdEcuxj6RMM5XjJt-4HWmBpfd0ixm_JDn2LIj2Te-i7j-sYrUr29VuV7cfjY7cvnQxHBqLFowHrbKIvTP9qK2hoefKN9CzAZk5aCG6YFC8E40KgZ1DVyB6HVAZ1Ykc3f2YiIx8sQv_1wPd7mEb9-mlbI |
| ContentType | Conference Proceeding |
| DBID | 6IE 6IL CBEJK RIE RIL |
| DOI | 10.1109/ICICDT.2009.5166284 |
| DatabaseName | IEEE Electronic Library (IEL) Conference Proceedings IEEE Xplore POP ALL IEEE Xplore All Conference Proceedings IEEE Electronic Library (IEL) IEEE Proceedings Order Plans (POP All) 1998-Present |
| DatabaseTitleList | |
| Database_xml | – sequence: 1 dbid: RIE name: IEEE Electronic Library (IEL) url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/ sourceTypes: Publisher |
| DeliveryMethod | fulltext_linktorsrc |
| Discipline | Engineering |
| EISBN | 9781424429349 142442934X |
| EndPage | 154 |
| ExternalDocumentID | 5166284 |
| Genre | orig-research |
| GroupedDBID | 6IE 6IF 6IH 6IK 6IL 6IN AAJGR AAWTH ADZIZ ALMA_UNASSIGNED_HOLDINGS BEFXN BFFAM BGNUA BKEBE BPEOZ CBEJK CHZPO IPLJI OCL RIE RIL |
| ID | FETCH-LOGICAL-i175t-d18a8d58e662683b872cad6af116263b843270630cc7916e601bbe291cf6ce93 |
| IEDL.DBID | RIE |
| ISBN | 1424429331 9781424429332 |
| ISSN | 2381-3555 |
| IngestDate | Wed Aug 27 02:11:40 EDT 2025 |
| IsPeerReviewed | false |
| IsScholarly | true |
| LCCN | 2008908577 |
| Language | English |
| LinkModel | DirectLink |
| MergedId | FETCHMERGED-LOGICAL-i175t-d18a8d58e662683b872cad6af116263b843270630cc7916e601bbe291cf6ce93 |
| PageCount | 6 |
| ParticipantIDs | ieee_primary_5166284 |
| PublicationCentury | 2000 |
| PublicationDate | 2009-May |
| PublicationDateYYYYMMDD | 2009-05-01 |
| PublicationDate_xml | – month: 05 year: 2009 text: 2009-May |
| PublicationDecade | 2000 |
| PublicationTitle | 2009 IEEE International Conference on IC Design and Technology |
| PublicationTitleAbbrev | ICICDT |
| PublicationYear | 2009 |
| Publisher | IEEE |
| Publisher_xml | – name: IEEE |
| SSID | ssj0000453128 ssj0002001151 ssj0055196 |
| Score | 1.7811295 |
| Snippet | Plastic electronics, thin-film-transistors on foil and ultra-thin chips on foil are technologies currently pursued to support the strongly emerging market for... |
| SourceID | ieee |
| SourceType | Publisher |
| StartPage | 149 |
| SubjectTerms | Circuit testing CMOS analog integrated circuits CMOS digital integrated circuits CMOS integrated circuits CMOS process CMOS technology Consumer electronics electrochemical processes flexible structures MOSFETs piezoresistivity Plastics Silicon stress System testing |
| Title | Technology and design aspects of ultra-thin silicon chips for bendable electronics |
| URI | https://ieeexplore.ieee.org/document/5166284 |
| hasFullText | 1 |
| inHoldings | 1 |
| isFullTextHit | |
| isPrint | |
| link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV3JTsMwELXanuDC0iJ2-cARt7Gz2DkXKooEQqhIvVVeJmqhSqsmufD1OE6aAuLALckhiRdpnmfee4PQjTFRxGQSEGCRTwIuDYnBA8KNDoCBlKF0LN_n6OEteJyG0xa6bbQwAODIZ9AvL10t36x0UabKBiG1LxZBG7W5iCqtVpNPsdDEpzWUfncFthLsNHQPCwziqtGcoMTG2HAr8rLhzqdb76f6ntX2RNSLB-PheHg3qYwt6-__aMTi4tDoAD1tR1DRTz76Ra76-vOXueN_h3iIejvFH35pYtkRakF6jPa_mRV20esuC49larBx3A8snVYzw6sEF8t8I0k-X6Q4WyztFkuxni_WGbbAGCuwh3-1BLxrvJP10GR0Pxk-kLojA1lYmJETQ4UUJhRgfzISvhKcaWkimVBautooEfiMly5eWnOLO8Ge9pQCFlOdRBpi_wR10lUKpwhzlhifgQYVJAH3QuEZSEq7NbtAsWZwhrrl5MzWlefGrJ6X878fX6C9qspTEhEvUSffFHBlwUKurt0u-QLYBLXF |
| linkProvider | IEEE |
| linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV3LTsJAFJ0gLtSNDzC-nYVLB5jptJ2uUQIKxBhM2JF53AaUFALtxq93-qCoceGu7aKZV3LP3HvOuQjdGeN5TIacAPMcwn1pSAAtIL7RHBhI6cqM5Tv0um_8aeyOK-i-1MIAQEY-g0b6mNXyzUInaaqs6VL7Y8F30K7LOXdztVaZUbHgxKEFmH7PSmwp3CkJHxYaBHmrOUGJjbLuRuZlA55DN-5PxTsrDIpoK2j22r32wyi3tixG8KMVSxaJOodosJlDTkD5aCSxaujPX_aO_53kEapvNX_4pYxmx6gC0Qk6-GZXWEOv2zw8lpHBJmN_YJmpNdd4EeJkHq8kiaezCK9nc3vIIqyns-UaW2iMFdjrv5oD3rbeWdfRqPM4andJ0ZOBzCzQiImhQgrjCrCD9ISjhM-0NJ4MKU19bZTgDvNTHy-tfYs8wd73lAIWUB16GgLnFFWjRQRnCPssNA4DDYqH3G-5omUgTA3X7AYFmsE5qqWLM1nmrhuTYl0u_v58i_a6o0F_0u8Nny_Rfl7zSWmJV6garxK4ttAhVjfZifkClYO5Eg |
| openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Abook&rft.genre=proceeding&rft.title=2009+IEEE+International+Conference+on+IC+Design+and+Technology&rft.atitle=Technology+and+design+aspects+of+ultra-thin+silicon+chips+for+bendable+electronics&rft.au=Richter%2C+H.&rft.au=Rempp%2C+H.D.&rft.au=Hassan%2C+M.-U.&rft.au=Harendt%2C+C.&rft.date=2009-05-01&rft.pub=IEEE&rft.isbn=9781424429332&rft.issn=2381-3555&rft.spage=149&rft.epage=154&rft_id=info:doi/10.1109%2FICICDT.2009.5166284&rft.externalDocID=5166284 |
| thumbnail_l | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=2381-3555&client=summon |
| thumbnail_m | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=2381-3555&client=summon |
| thumbnail_s | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=2381-3555&client=summon |