Akhtar, Y., Maity, S., & Chandrasekharan, R. C. (2016, December). Generating Test Suites with High 3-Way Coverage for Software Testing. 2016 IEEE International Conference on Computer and Information Technology (CIT), 10-17. https://doi.org/10.1109/CIT.2016.89
Chicago Style (17th ed.) CitationAkhtar, Yasmeen, Soumen Maity, and Reshma C. Chandrasekharan. "Generating Test Suites with High 3-Way Coverage for Software Testing." 2016 IEEE International Conference on Computer and Information Technology (CIT) Dec. 2016: 10-17. https://doi.org/10.1109/CIT.2016.89.
MLA (9th ed.) CitationAkhtar, Yasmeen, et al. "Generating Test Suites with High 3-Way Coverage for Software Testing." 2016 IEEE International Conference on Computer and Information Technology (CIT), Dec. 2016, pp. 10-17, https://doi.org/10.1109/CIT.2016.89.