Application of Data Mining Based Scan Diagnosis Yield Analysis in a Foundry and Fabless Working Environment - Shen, Hao; Shen, Lance; Xu, Pierce; Yang, Wu; Zhong, Junna (Proceedings - Asian Test Symposium, 2016)
Keywords: Data mining; Deconvolution; diagnosis; Failure analysis; Foundries; Graphics; Manufacturing; pfa; RCD; root cause; yield analysis