APA (7th ed.) Citation

Shen, H., Shen, L., Xu, P., Yang, W., & Zhong, J. (2016, November). Application of Data Mining Based Scan Diagnosis Yield Analysis in a Foundry and Fabless Working Environment. Proceedings - Asian Test Symposium, 128. https://doi.org/10.1109/ATS.2016.66

Chicago Style (17th ed.) Citation

Shen, Hao, Lance Shen, Pierce Xu, Wu Yang, and Junna Zhong. "Application of Data Mining Based Scan Diagnosis Yield Analysis in a Foundry and Fabless Working Environment." Proceedings - Asian Test Symposium Nov. 2016: 128. https://doi.org/10.1109/ATS.2016.66.

MLA (9th ed.) Citation

Shen, Hao, et al. "Application of Data Mining Based Scan Diagnosis Yield Analysis in a Foundry and Fabless Working Environment." Proceedings - Asian Test Symposium, Nov. 2016, p. 128, https://doi.org/10.1109/ATS.2016.66.