Large random telegraph noise in sub-threshold operation of nano-scale nMOSFETs - Campbell, J.P.; Yu, L.C.; Cheung, K.P.; Qin, J.; Suehle, J.S.; Oates, A.; Sheng, K. (2009 IEEE International Conference on IC Design and Technology, 2009)
Keywords: Circuit noise; Circuit simulation; Fluctuations; Low-frequency noise; MOSFETs; Noise reduction; Random access memory; RTN; Semiconductor device noise; Sub-V TH operation; Telegraphy; Voltage