Yagoub, M., & Sharma, P. (2004). Characterization of EM effects in RF/microwave integrated circuits. 34th European Microwave Conference 2004 : conference proceedings : Tuesday 12th, Wednesday 13th and Thursday 14th October, 1, 221-224.
Chicago Style (17th ed.) CitationYagoub, M.C.E, and P. Sharma. "Characterization of EM Effects in RF/microwave Integrated Circuits." 34th European Microwave Conference 2004 : Conference Proceedings : Tuesday 12th, Wednesday 13th and Thursday 14th October 1 (2004): 221-224.
MLA (9th ed.) CitationYagoub, M.C.E, and P. Sharma. "Characterization of EM Effects in RF/microwave Integrated Circuits." 34th European Microwave Conference 2004 : Conference Proceedings : Tuesday 12th, Wednesday 13th and Thursday 14th October, vol. 1, 2004, pp. 221-224.