APA (7th ed.) Citation

Yang, T., Li, K., Chiang, Y., Lin, W., Lin, H., & Chang, M. (2018, February). A 28nm 32Kb embedded 2T2MTJ STT-MRAM macro with 1.3ns read-access time for fast and reliable read applications. Digest of technical papers - IEEE International Solid-State Circuits Conference, 482-484. https://doi.org/10.1109/ISSCC.2018.8310394

Chicago Style (17th ed.) Citation

Yang, Tzu-Hsien, Kai-Xiang Li, Yen-Ning Chiang, Wei-Yu Lin, Huan-Ting Lin, and Meng-Fan Chang. "A 28nm 32Kb Embedded 2T2MTJ STT-MRAM Macro with 1.3ns Read-access Time for Fast and Reliable Read Applications." Digest of Technical Papers - IEEE International Solid-State Circuits Conference Feb. 2018: 482-484. https://doi.org/10.1109/ISSCC.2018.8310394.

MLA (9th ed.) Citation

Yang, Tzu-Hsien, et al. "A 28nm 32Kb Embedded 2T2MTJ STT-MRAM Macro with 1.3ns Read-access Time for Fast and Reliable Read Applications." Digest of Technical Papers - IEEE International Solid-State Circuits Conference, Feb. 2018, pp. 482-484, https://doi.org/10.1109/ISSCC.2018.8310394.