Impact of Redundancy and Line Extension on Short-Length Effect in Electromigration Reliability - Esposto, Simone; Ciofi, Ivan; Sisto, Giuliano; Croes, Kristof; Milojevic, Dragomir; Zahedmanesh, Houman (Proceedings of the IEEE International Interconnect Technology Conference, 2025)
Keywords: Electromigration; parallel system; PDN redundancy; power delivery network; short-length effect