APA (7th ed.) Citation

Bai, X., Zheng, W., Yang, W., Wang, G., & Liao, Q. (2023, October 8). Hard Samples Based Margin Loss for Face Verification. 2023 IEEE International Conference on Image Processing (ICIP), 3513-3517. https://doi.org/10.1109/ICIP49359.2023.10222437

Chicago Style (17th ed.) Citation

Bai, Xiaying, Wenxian Zheng, Wenming Yang, Guijin Wang, and Qingmin Liao. "Hard Samples Based Margin Loss for Face Verification." 2023 IEEE International Conference on Image Processing (ICIP) 8 Oct. 2023: 3513-3517. https://doi.org/10.1109/ICIP49359.2023.10222437.

MLA (9th ed.) Citation

Bai, Xiaying, et al. "Hard Samples Based Margin Loss for Face Verification." 2023 IEEE International Conference on Image Processing (ICIP), 8 Oct. 2023, pp. 3513-3517, https://doi.org/10.1109/ICIP49359.2023.10222437.