Disease Detection in Potato Leaves Using an Efficient Deep Learning Model

Early blight and late blight are two diseases that put a massive hazard on potato crops and leave farmers feeling helpless. Early automatic recognition of these diseases will preserve time and enable farmers to act immediately on diseased crops. Machine learning and deep learning techniques offers v...

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Published in2023 International Conference on Data Science and Network Security (ICDSNS) pp. 01 - 05
Main Authors Goyal, Bhanu, Kumar Pandey, Anil, Kumar, Rakesh, Gupta, Meenu
Format Conference Proceeding
LanguageEnglish
Published IEEE 28.07.2023
Subjects
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DOI10.1109/ICDSNS58469.2023.10245369

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Abstract Early blight and late blight are two diseases that put a massive hazard on potato crops and leave farmers feeling helpless. Early automatic recognition of these diseases will preserve time and enable farmers to act immediately on diseased crops. Machine learning and deep learning techniques offers variety of solutions for detecting rust in diseased crops. However, techniques of explaining such solutions are not common, but are essential because some machine learning models are considered to be as black boxes. In agriculture, the control of potato diseases is important because they lead to crop losses. Therefore, it should be identified and classified as a potato leaf disease to reduce losses. Doing it manually takes time. To solve the problems of mentioned above, an perfect and programmed technique for rapid identification and grouping of disease is desirable. In this study, machine learning and deep learning methods are used to organize potato leaves in two clusters using a present dataset called "Plant Village Dataset". To classify potato leaves into five groups, namely Potato Late Blight (PLB), Potato Early Blight (PEB) and Potato Healthy (PH) classes, this paper proposes a method based on algorithm of enhanced deep learning. The model is trained using the preexisting "The Plant Village" dataset, which consists of images with two diseases. To analyze the performance of the model, 1964 images of potato leaf disease have been collected from the Kaggle repository, out of which 54 sets of images are selected for training, 6 samples for data validation and 6 samples for testing, belonging to all categories. In the result analysis section, the SVM model performance is calculated at testing phase, and its correctness reached to 99.42%. Extensive testing has been made to demonstrate that our planned algorithm is more reliable and performs better than existing models in identifying and arranging potato leaf diseases.
AbstractList Early blight and late blight are two diseases that put a massive hazard on potato crops and leave farmers feeling helpless. Early automatic recognition of these diseases will preserve time and enable farmers to act immediately on diseased crops. Machine learning and deep learning techniques offers variety of solutions for detecting rust in diseased crops. However, techniques of explaining such solutions are not common, but are essential because some machine learning models are considered to be as black boxes. In agriculture, the control of potato diseases is important because they lead to crop losses. Therefore, it should be identified and classified as a potato leaf disease to reduce losses. Doing it manually takes time. To solve the problems of mentioned above, an perfect and programmed technique for rapid identification and grouping of disease is desirable. In this study, machine learning and deep learning methods are used to organize potato leaves in two clusters using a present dataset called "Plant Village Dataset". To classify potato leaves into five groups, namely Potato Late Blight (PLB), Potato Early Blight (PEB) and Potato Healthy (PH) classes, this paper proposes a method based on algorithm of enhanced deep learning. The model is trained using the preexisting "The Plant Village" dataset, which consists of images with two diseases. To analyze the performance of the model, 1964 images of potato leaf disease have been collected from the Kaggle repository, out of which 54 sets of images are selected for training, 6 samples for data validation and 6 samples for testing, belonging to all categories. In the result analysis section, the SVM model performance is calculated at testing phase, and its correctness reached to 99.42%. Extensive testing has been made to demonstrate that our planned algorithm is more reliable and performs better than existing models in identifying and arranging potato leaf diseases.
Author Goyal, Bhanu
Kumar Pandey, Anil
Gupta, Meenu
Kumar, Rakesh
Author_xml – sequence: 1
  givenname: Bhanu
  surname: Goyal
  fullname: Goyal, Bhanu
  email: 19bet1029@cuchd.in
  organization: Chandigarh University,Department of Computer Science & Engineering,Punjab,India
– sequence: 2
  givenname: Anil
  surname: Kumar Pandey
  fullname: Kumar Pandey, Anil
  email: 19bcs2431@gmail.com
  organization: Chandigarh University,Department of Computer Science & Engineering,Punjab,India
– sequence: 3
  givenname: Rakesh
  surname: Kumar
  fullname: Kumar, Rakesh
  email: rakesh.e8623@cumail.in
  organization: Chandigarh University,Department of Computer Science & Engineering,Punjab,India
– sequence: 4
  givenname: Meenu
  surname: Gupta
  fullname: Gupta, Meenu
  email: meenu.e9406@cumail.in
  organization: Chandigarh University,Department of Computer Science & Engineering,Punjab,India
BookMark eNo1j81KxDAUhSPoQsd5AxfxAVpvkqbtXUo7aqH-wIzrIU1vJDCmQxME394O6upw-D4OnCt2HqZAjN0KyIUAvOuadvuy1XVRYi5BqlyALLQq8YytscJaaVAgNOpL1rU-konEW0pkk58C94G_Tcmkifdkvijy9-jDBzeBb5zz1lNIi03HE57DCT1PIx2u2YUzh0jrv1yx3cNm1zxl_etj19z3mRcCUzY4kJJcbSS40Q5UKY1Y1mOhoBwIdWWE1CM5W4hi6bZWpQEcQcLCQKgVu_md9US0P87-08zf-_-D6gdEnUqS
ContentType Conference Proceeding
DBID 6IE
6IL
CBEJK
RIE
RIL
DOI 10.1109/ICDSNS58469.2023.10245369
DatabaseName IEEE Electronic Library (IEL) Conference Proceedings
IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume
IEEE Xplore All Conference Proceedings
IEEE Electronic Library (IEL)
IEEE Proceedings Order Plans (POP All) 1998-Present
DatabaseTitleList
Database_xml – sequence: 1
  dbid: RIE
  name: IEEE Electronic Library (IEL)
  url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/
  sourceTypes: Publisher
DeliveryMethod fulltext_linktorsrc
EISBN 9798350301595
EndPage 05
ExternalDocumentID 10245369
Genre orig-research
GroupedDBID 6IE
6IL
CBEJK
RIE
RIL
ID FETCH-LOGICAL-i119t-bf022ef8a20fdcbe7359968d4306be957a125defc414be9c836a09d020957013
IEDL.DBID RIE
IngestDate Wed Sep 27 05:40:29 EDT 2023
IsPeerReviewed false
IsScholarly false
Language English
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-i119t-bf022ef8a20fdcbe7359968d4306be957a125defc414be9c836a09d020957013
PageCount 5
ParticipantIDs ieee_primary_10245369
PublicationCentury 2000
PublicationDate 2023-July-28
PublicationDateYYYYMMDD 2023-07-28
PublicationDate_xml – month: 07
  year: 2023
  text: 2023-July-28
  day: 28
PublicationDecade 2020
PublicationTitle 2023 International Conference on Data Science and Network Security (ICDSNS)
PublicationTitleAbbrev ICDSNS
PublicationYear 2023
Publisher IEEE
Publisher_xml – name: IEEE
Score 1.9011813
Snippet Early blight and late blight are two diseases that put a massive hazard on potato crops and leave farmers feeling helpless. Early automatic recognition of...
SourceID ieee
SourceType Publisher
StartPage 01
SubjectTerms Analytical models
Convolutional Neural Network (CNN)
Crops
Data models
Decision Support System(DSS)
Deep learning
Deep Learning (DL)
Network security
ResNet-9
Support Vector Machine (SVM)
Support vector machines
Training
Title Disease Detection in Potato Leaves Using an Efficient Deep Learning Model
URI https://ieeexplore.ieee.org/document/10245369
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1dS8MwFA1uD-KTihO_ieBra7-TPK8bm-gYbMLeRj5uZSjt0M4Hf703aacoCL41bWhLQjgnN_ecS8hNwLXWTHMvAx15iYwDj0uIPSTDItWhUWBsvONhko0ek7tFumjF6k4LAwAu-Qx8e-nO8k2lNzZUhis8StI4Ex3SYUw0Yq1dct36Zt6O-_lsMrOIahUoUexv-_-onOKAY7hPJttPNvkiz_6mVr7--OXG-O9_OiC9b40enX6hzyHZgfKIjPPmvIXmULscq5KuSjqtkFFW9B7kO7xRlyRAZUkHzj0C3469YU1bp9UnasujvfTIfDiY90deWyzBW4WhqD1VIBpDwWUUFEYrYLE1XuEmwT2BApEyiVTGQKGTMMG25nEmA2GQLeIz5IHHpFtWJZwQqgthjFJhzHDrp6JACch4kTItQ4VkKTglPTsMy3Vjh7HcjsDZH_fPyZ6dDRsQjfgF6davG7hEJK_VlZvBT08enqo
linkProvider IEEE
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1bS8MwFD7oBPVJxYl3I_ja2kvaps_bZNOtDDZhbyOXUxlKO7TzwV9vknaKguBb26QXEsr35eR83wG48ZiUMpHMiVEGDuWh5zCOoaPJcBpJXwlUJt4xyuL-I72fRbNGrG61MIhok8_QNYd2L1-VcmVCZfoPD2gUxukmbEWUJkEt19qG68Y583bQ6U6yicFUo0EJQnd9x4_aKRY67vYgW7-0zhh5dleVcOXHLz_Gf3_VPrS_VXpk_IU_B7CBxSEMuvWOC-liZbOsCrIoyLjUnLIkQ-Tv-EZsmgDhBelZ_wj9dN0bl6TxWn0ipkDaSxumd71pp-805RKche-nlSNyjceYMx54uZICk9BYrzBF9apAYBolXJMZhbmkPtXnkoUx91Kl-aJu00zwCFpFWeAxEJmnSgnhh4le_InAEynGLI8SyX2h6ZJ3Am0zDPNlbYgxX4_A6R_Xr2CnPx0N58NB9nAGu2ZmTHg0YOfQql5XeKFxvRKXdjY_AcwxofU
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Abook&rft.genre=proceeding&rft.title=2023+International+Conference+on+Data+Science+and+Network+Security+%28ICDSNS%29&rft.atitle=Disease+Detection+in+Potato+Leaves+Using+an+Efficient+Deep+Learning+Model&rft.au=Goyal%2C+Bhanu&rft.au=Kumar+Pandey%2C+Anil&rft.au=Kumar%2C+Rakesh&rft.au=Gupta%2C+Meenu&rft.date=2023-07-28&rft.pub=IEEE&rft.spage=01&rft.epage=05&rft_id=info:doi/10.1109%2FICDSNS58469.2023.10245369&rft.externalDocID=10245369