Interference-induced Electromagnetic Emission in Functioning Operating States of Integrated Circuits - Czepl, Nikolaus; Kircher, Daniel; Deutschmann, Bernd (IEEE International Symposium on Electromagnetic Compatibility (EMC Europe), 2023)
Keywords: Combined EMC testing; Direct Power Injection (DPI); Electromagnetic compatibility; Electromagnetic Compatibility (EMC); Electromagnetic Interference (EMI); Frequency measurement; Functional Safety (FS); IEC 61967; IEC 62132; Integrated circuits; ISO 26262; Pins; Radio Frequency Interference (RFI); Safety; Semiconductor device measurement; Switches