Czepl, N., Kircher, D., & Deutschmann, B. (2023, September 4). Interference-induced Electromagnetic Emission in Functioning Operating States of Integrated Circuits. IEEE International Symposium on Electromagnetic Compatibility (EMC Europe), 1-4. https://doi.org/10.1109/EMCEurope57790.2023.10274321
Chicago Style (17th ed.) CitationCzepl, Nikolaus, Daniel Kircher, and Bernd Deutschmann. "Interference-induced Electromagnetic Emission in Functioning Operating States of Integrated Circuits." IEEE International Symposium on Electromagnetic Compatibility (EMC Europe) 4 Sep. 2023: 1-4. https://doi.org/10.1109/EMCEurope57790.2023.10274321.
MLA (9th ed.) CitationCzepl, Nikolaus, et al. "Interference-induced Electromagnetic Emission in Functioning Operating States of Integrated Circuits." IEEE International Symposium on Electromagnetic Compatibility (EMC Europe), 4 Sep. 2023, pp. 1-4, https://doi.org/10.1109/EMCEurope57790.2023.10274321.