Verification of Circuit Signal Detection Method for Non-contact Measurement System - Guo, Min-Jun; Lin, Shu-Yu; Wang, Yu-Cong; Hsieh, Chia-Lin; Wu, Sung-Mao; Chou, Shang-Chih (2023 International Conference on Electronics Packaging (ICEP), 2023)
Keywords: De-embedding Technique; Electromagnetic compatibility; Equivalent Circuit Model; Impedance; Junctions; Near Field Measurement; Non-contact Signal Excite; Power transmission lines; Probes; Reflection; Transmission line measurements