Behavioral and Clinical Data Analysis for Autism Spectrum Disorder Screening with Machine Learning - Kumar, Rakesh; Bordoloi, Dibyhash; Shrivastava, Anurag; Kumar, C Praveen; Kumari, Vandna; Kumar, Anil (IEEE Uttar Pradesh Section International Conference on Electrical, Computer and Electronics (Online), 2023)
Keywords: Autism; Autism Spectrum Disorder (ASD); Behavioral sciences; Data analysis; Electroencephalogram (EEG); Logistic Regression; Machine learning; Neural network; Philosophical considerations; restricted and repetitive behaviours; Statistical analysis; Support vector machines; SVM