Thermal Analysis of Printed Circuit Board Due to Thermal Stress By Using Thermography and Holography
By using both FEMLAB simulator and the Thermography, the thermal pattern was analyzed of printed circuit board deformed due to thermal stress. And, the deformation pattern was measured by using the holographic pattern measuring system (HPMS). As the results, both thermal pattern and deformation patt...
Saved in:
Published in | 2005 IEEE Instrumentationand Measurement Technology Conference Proceedings Vol. 3; pp. 1965 - 1969 |
---|---|
Main Authors | , , , , |
Format | Conference Proceeding |
Language | English Japanese |
Published |
IEEE
22.03.2006
|
Subjects | |
Online Access | Get full text |
ISBN | 9780780388796 0780388798 |
ISSN | 1091-5281 |
DOI | 10.1109/IMTC.2005.1604515 |
Cover
Abstract | By using both FEMLAB simulator and the Thermography, the thermal pattern was analyzed of printed circuit board deformed due to thermal stress. And, the deformation pattern was measured by using the holographic pattern measuring system (HPMS). As the results, both thermal pattern and deformation pattern were observed as a different pattern each other. And, we found that the HPMS could be effectively used as a tool for analyzing PCB deformation with 3-D graphic image |
---|---|
AbstractList | By using both FEMLAB simulator and the Thermography, the thermal pattern was analyzed of printed circuit board deformed due to thermal stress. And, the deformation pattern was measured by using the holographic pattern measuring system (HPMS). As the results, both thermal pattern and deformation pattern were observed as a different pattern each other. And, we found that the HPMS could be effectively used as a tool for analyzing PCB deformation with 3-D graphic image |
Author | Netsu, T. Taniguchi, M. Yanada, T. Takagi, T. Ishida, H. |
Author_xml | – sequence: 1 givenname: T. surname: Netsu fullname: Netsu, T. organization: Fac. of Sci. & Technol., Tohoku Bunka Gakuen Univ., Sendai – sequence: 2 givenname: M. surname: Taniguchi fullname: Taniguchi, M. organization: Fac. of Sci. & Technol., Tohoku Bunka Gakuen Univ., Sendai – sequence: 3 givenname: H. surname: Ishida fullname: Ishida, H. organization: Fac. of Sci. & Technol., Tohoku Bunka Gakuen Univ., Sendai – sequence: 4 givenname: T. surname: Yanada fullname: Yanada, T. organization: Fac. of Sci. & Technol., Tohoku Bunka Gakuen Univ., Sendai – sequence: 5 givenname: T. surname: Takagi fullname: Takagi, T. organization: Fac. of Sci. & Technol., Tohoku Bunka Gakuen Univ., Sendai |
BookMark | eNo1UM1qwkAYXKiFqvUBSi_7ArHf_m-OmtYqWFpoepZN8kW3xER24yFvX0ELA8MMM3OYCRm1XYuEPDGYMwbpy-Yjz-YcQM2ZBqmYuiOz1Fi4QFhrUj0i40uOJYpb9kAmMf4CgJbGjEmVHzAcXUMXrWuG6CPtavoVfNtjRTMfyrPv6bJzoaKvZ6R9R_8L333AGOlyoD_Rt_ur3-2DOx0G6tqKrrvmJh_Jfe2aiLMbT0m-esuzdbL9fN9ki23iGVMykbxCkZZgalZr5FyqumSpFaVAbgpwtrDKAliuuUiFTp2SWqKRBdSsQC2m5Pk66xFxdwr-6MKwu30i_gAGKlaK |
ContentType | Conference Proceeding |
DBID | 6IE 6IH CBEJK RIE RIO |
DOI | 10.1109/IMTC.2005.1604515 |
DatabaseName | IEEE Electronic Library (IEL) Conference Proceedings IEEE Proceedings Order Plan (POP) 1998-present by volume IEEE Xplore All Conference Proceedings IEEE Electronic Library (IEL) IEEE Proceedings Order Plans (POP) 1998-present |
DatabaseTitleList | |
Database_xml | – sequence: 1 dbid: RIE name: IEEE Electronic Library (IEL)【Remote access available】 url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/ sourceTypes: Publisher |
DeliveryMethod | fulltext_linktorsrc |
Discipline | Engineering Physics |
EndPage | 1969 |
ExternalDocumentID | 1604515 |
Genre | orig-research |
GroupedDBID | 29F 6IE 6IH CBEJK RIE RIO |
ID | FETCH-LOGICAL-i1154-42de39c07f1f6e2245fc1983c3e27b0a8b85800826239369a5464e74b0f1be63 |
IEDL.DBID | RIE |
ISBN | 9780780388796 0780388798 |
ISSN | 1091-5281 |
IngestDate | Wed Aug 27 02:03:40 EDT 2025 |
IsPeerReviewed | false |
IsScholarly | false |
Language | English Japanese |
LinkModel | DirectLink |
MergedId | FETCHMERGED-LOGICAL-i1154-42de39c07f1f6e2245fc1983c3e27b0a8b85800826239369a5464e74b0f1be63 |
PageCount | 5 |
ParticipantIDs | ieee_primary_1604515 |
PublicationCentury | 2000 |
PublicationDate | 2006-03-22 |
PublicationDateYYYYMMDD | 2006-03-22 |
PublicationDate_xml | – month: 03 year: 2006 text: 2006-03-22 day: 22 |
PublicationDecade | 2000 |
PublicationTitle | 2005 IEEE Instrumentationand Measurement Technology Conference Proceedings |
PublicationTitleAbbrev | IMTC |
PublicationYear | 2006 |
Publisher | IEEE |
Publisher_xml | – name: IEEE |
SSID | ssj0006477 ssj0000827799 |
Score | 1.3612313 |
Snippet | By using both FEMLAB simulator and the Thermography, the thermal pattern was analyzed of printed circuit board deformed due to thermal stress. And, the... |
SourceID | ieee |
SourceType | Publisher |
StartPage | 1965 |
SubjectTerms | Analytical models Circuit analysis Circuit simulation Deformable models Deformation analysis Graphics Holography Image analysis Pattern analysis Printed circuit board Printed circuits Thermal stress Thermal stresses Thermography |
Title | Thermal Analysis of Printed Circuit Board Due to Thermal Stress By Using Thermography and Holography |
URI | https://ieeexplore.ieee.org/document/1604515 |
Volume | 3 |
hasFullText | 1 |
inHoldings | 1 |
isFullTextHit | |
isPrint | |
link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjZ3LS8MwGMDDNhD0om4T3-Tg0Wxrm6bJdVOZwkRwwm4jj68wlFVme9C_3iR9-MCDtzY0tEk_vi_5Hr8gdJFoDnZnZUismCCUUUYEg5ioVDKjqObSg-dn92z6RO8W8aKFLptaGADwyWcwcJc-lm8yXThX2TBgjoYSt1HbillZq9X4U6wpS3yEqtLCrsDSRzpFYDdbPPBbdu7YJ4ngFXmnvmdVuNM-PLydzSelq6V6249jV7zVudlFs_p7y2ST50GRq4H--IVy_O-A9lD_q74PPzSWax-1YN1FO9_QhF205VND9VsPGStJVnu_4JpfgrPU9nacCYMnq40uVjkeZ1bS8FUBOM9w3eHR16Hg8Tv2iQlle4XIxnJt8LQhZvfR_OZ6PpmS6mwGsnIAH0JDA5HQoyQNUgZ2HRCnOhA80hGEiRpJrnjM3U9hjrHGhIytHEBC1SgNFLDoAHXW2RoOEeagZGgcJl-GlCsqlbJGU1pNIjhIBUeo5yZu-VrSN5bVnB3_3XyCtksnSUTC8BR18k0BZ3bZkKtzLy-fs-65tg |
linkProvider | IEEE |
linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjZ3NT8IwFMBfEGPUiwoYv-3BowP21XVXUALKiImYcCNt95YQDTO4HfSvt-3G_IgHb1uzZmv30tf39SvAVSAZKssqtnxBQ8ujHrVCir4lEk5j4UnGDXg-mtDhk3c382c1uK5qYRDRJJ9hW1-aWH6cyly7yjo21TQUfwM2fWVVsKJaq_KoKGUWmBhVuQ7rEksT6wxtZW4x2xjtTNNPgpCV7J31PS0Dnurhziia9gtnS_m-HwevGL0z2INo_cVFuslzO89EW378gjn-d0j70Pqq8CMPle46gBouG7D7DU7YgC2THCrfmhArWVLr9wtZE0xImqjemjQRk_5iJfNFRnqpkjVykyPJUrLu8GgqUUjvnZjUhKK9hGQTvozJsGJmt2A6uJ32h1Z5OoO10Agfy3NidEPZDRI7oah2An4i7ZC50kUnEF3OBPOZ_ilUU9ZoyH0lCRh4opvYAql7CPVlusQjIAwFd2INyueOx4THhVBqk6u1JGTIBR5DU0_c_LXgb8zLOTv5u_kStofTaDwfjyb3p7BTuExcy3HOoJ6tcjxXm4hMXBjZ-QSw970J |
openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Abook&rft.genre=proceeding&rft.title=2005+IEEE+Instrumentationand+Measurement+Technology+Conference+Proceedings&rft.atitle=Thermal+Analysis+of+Printed+Circuit+Board+Due+to+Thermal+Stress+By+Using+Thermography+and+Holography&rft.au=Netsu%2C+T.&rft.au=Taniguchi%2C+M.&rft.au=Ishida%2C+H.&rft.au=Yanada%2C+T.&rft.date=2006-03-22&rft.pub=IEEE&rft.isbn=9780780388796&rft.issn=1091-5281&rft.volume=3&rft.spage=1965&rft.epage=1969&rft_id=info:doi/10.1109%2FIMTC.2005.1604515&rft.externalDocID=1604515 |
thumbnail_l | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=1091-5281&client=summon |
thumbnail_m | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=1091-5281&client=summon |
thumbnail_s | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=1091-5281&client=summon |