A Novel Method for Testing the Electromagnetic Immunity of the Short Circuit Protection Function of Smart Power Switches - Kircher, Daniel; Deutschmann, Bernd; Helldorff, Heinrich (Asia-Pacific International Symposium on Electromagnetic Compatibility, 2024)
Keywords: combined effects; combined testing; direct power injection (DPI); electromagnetic compatibility (EMC); electromagnetic immunity; Electromagnetic interference; Electromagnetics; functional safety (FS); Immunity testing; Performance evaluation; Protection; Robustness; short circuit; Switches