Injecting single event upsets in a digital signal processor by means of direct memory access requests: a new method for generating bit flips

In this paper a novel approach for injecting Single Event Upsets, (SEU), by means of direct memory access, (DMA), mechanisms is presented. The system consists in a PC based control unit that generates DMA requests randomly in time to a board containing the processor under test, and a test unit. Expe...

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Bibliographic Details
Published in2001 6th European Conference on Radiation and Its Effects on Components and Systems pp. 248 - 252
Main Authors Ferreyra, P.A., Marques, C.A., Velazco, R., Calvo, O.
Format Conference Proceeding
LanguageEnglish
Published IEEE 2001
Subjects
Circuit faults
Circuit simulation
Digital signal processors
Field programmable gate arrays
Registers
Signal generators
Single event transient
Single event upset
Software tools
Testing
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ISBN9780780373136
0780373138
DOI10.1109/RADECS.2001.1159288

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Summary:In this paper a novel approach for injecting Single Event Upsets, (SEU), by means of direct memory access, (DMA), mechanisms is presented. The system consists in a PC based control unit that generates DMA requests randomly in time to a board containing the processor under test, and a test unit. Experimentation performed on a digital signal processor intended to be used in a satellite project illustrates the potentialities of the proposed approach.
ISBN:9780780373136
0780373138
DOI:10.1109/RADECS.2001.1159288