APA (7th ed.) Citation

Le Quere, E., Dauzere-Peres, S., Tamssaouet, K., Maufront, C., & Astie, S. (2020, December 14). Dynamic Sampling for Risk Minimization in Semiconductor Manufacturing. Proceedings - Winter Simulation Conference, 1886-1897. https://doi.org/10.1109/WSC48552.2020.9384001

Chicago Style (17th ed.) Citation

Le Quere, Etienne, Stephane Dauzere-Peres, Karim Tamssaouet, Cedric Maufront, and Stephane Astie. "Dynamic Sampling for Risk Minimization in Semiconductor Manufacturing." Proceedings - Winter Simulation Conference 14 Dec. 2020: 1886-1897. https://doi.org/10.1109/WSC48552.2020.9384001.

MLA (9th ed.) Citation

Le Quere, Etienne, et al. "Dynamic Sampling for Risk Minimization in Semiconductor Manufacturing." Proceedings - Winter Simulation Conference, 14 Dec. 2020, pp. 1886-1897, https://doi.org/10.1109/WSC48552.2020.9384001.