Combined altitude and underground real-time SER characterization of CMOS technologies on the ASTEP-LSM platform - Autran, J.L.; Roche, P.; Sauze, S.; Gasiot, G.; Munteanu, D.; Loaiza, P.; Zampaolo, M.; Borel, J.; Rozov, S.; Yakushev, E. (2009 IEEE International Conference on IC Design and Technology, 2009)
Keywords: accelerated tests; alpha contamination; atmospheric neutrons; Circuit testing; CMOS technology; Contamination; Cosmic rays; Impurities; Laboratories; Microelectronics; Nanostructured materials; neutron-induced SER; Neutrons; Performance evaluation; real-time testing; SER simulation; Single-Event Rate (SER); static memory; terrestrial radiation environment