Improving an SEU hard design using a pulsed laser - Dutertre, J.M.; Roche, F.M.; Fouillat, P.; Lewis, D. (2001 6th European Conference on Radiation and Its Effects on Components and Systems, 2001)
Keywords: Circuit testing; CMOS technology; Design optimization; Flip-flops; Logic; Optical design; Optical pulses; Radiation hardening; Robustness; Single event upset