Spectromicroscopy of ultrathin Pd films on W(1 1 0):: interplay of morphology and electronic structure - Aballe, L.; Barinov, A.; Locatelli, A.; Heun, S.; Cherifi, S.; Kiskinova, M. (Applied surface science, 2004)
Keywords: Applied sciences; Condensed matter: electronic structure, electrical, magnetic, and optical properties; Condensed matter: structure, mechanical and thermal properties; Electronic structure; Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures; Exact sciences and technology; LEEM; Metals. Metallurgy; Morphology; Physics; Surface and interface electron states; Surface states, band structure, electron density of states; Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties); Thin film structure and morphology; Ultrathin Pd films; XPEEM; 68.37.Nq; 68.55.−a; LEEM; Electronic structure; 73.20.At; Ultrathin Pd films; 79.60.Dp; Morphology; XPEEM; Ultrathin films; Photoelectron microscopy; 68.55.-a Ultrathin Pd films; 79.60.Dp: 68.37.Nq; Palladium; Electron microscopy; Surface structure; LEED