High-throughput XPS spectrum modeling with autonomous background subtraction for 3d5/2 peak mapping of SnS - Tarojiro Matsumura; Naoka Nagamura; Shotaro Akaho; Kenji Nagata; Yasunobu Ando (Science and technology of advanced materials. Methods, 2023)
Keywords: background subtraction; expectation-conditional maximization algorithm; high-throughput analysis; peak fitting; x-ray photoelectron spectroscopy