RESEARCH OF VOLTAMPER CHARACTERISTICS OF SEMICONDUCTOR STRUCTURES AND DEVICES - E.A. Pecherskaya; O.V. Karpanin; D.E. Nelyutskovа; M.A. Nelyutskov; V.S. Aleksandrov; A.E. Zhurina (Измерение, мониторинг, управление, контроль, 2024)
Keywords: automated measuring system; current-voltage characteristics; methods of measuring electrophysical parameters of semiconductors; semiconductor structures and devices